OAL Interrupt Tests
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8/27/2008
The OAL Interrupt Tests assess the behavior of Interrupt-related I/O controls (IOCTLs) in the OEM Adaptation Layer (OAL). The tests verify that the IOCTLs process parameters correctly and that the return values are correct.
The OAL Interrupt Tests exercise the following IOCTLs:
- IOCTL_HAL_REQUEST_SYSINTR
- IOCTL_HAL_RELEASE_SYSINTR
- IOCTL_HAL_REQUEST_IRQ
You can achieve good test coverage of the interrupts using the OAL Timer Tests and the OAL KITL Tests. A full interrupt testing solution should therefore include these tests as well as the OAL Interrupt Tests. Interrupt testing cannot be isolated from the device drivers that use these interrupts or from the timer routines that use the system tick.
In This Section
- Interrupt IOCTLs Test (Kernel Mode)
Kernel mode testing of the Interrupt IOCTLs
- Interrupt IOCTLs Test (User Mode)
User mode testing of the Interrupt IOCTLs