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Device-Independent Bitmap Test Module

Other versions of this page are also available for the following:

Windows Mobile Not SupportedWindows Embedded CE Supported

8/27/2008

The device-independent bitmap test module, S2_dib.dll, creates device-independent bitmaps (DIBs) with random parameters. The test module blits the DIBs to a window. This test module directly exercises the CreateDIBSection function. The test module also exercises the API for palette creation and use, and tests the BitBlt function.

This test module does not require a server.

To run the device-independent bitmap test module, graphic device interface (GDI) must be present in the Windows Embedded CE OS. GDI is present on all display-based operating systems, but is not present on most headless operating systems.

To set the random seed for this test module, you can provide the value of the seed following the s2_dib command.

See Also

Other Resources

Test Modules for the Windows Embedded CE Stress Tool